| 稀土La自组装纳米膜的制备及表征 |
| |
| 引用本文： | 朱大昌,朱劲松.稀土La自组装纳米膜的制备及表征[J].电子工业专用设备,2005,34(10):39-41. |
| |
| 作者姓名： | 朱大昌 朱劲松 |
| |
| 作者单位： | 1. 北京交通大学机电工程学院,北京,100044
2. 英特尔(上海)产品有限公司,EPAE,上海,200336 |
| |
| 摘 要： | 电子封装表面材料采用分子自组装技术制备了稀土La纳米膜,采用AFM(原子力显微镜)对组装膜的表面形貌进行表征,表征结果该稀土纳米膜表面形貌致密,表面粒子尺寸为20～30nm;场发射扫描电镜测试表明,该组装膜的成分为La;
|
| 关 键 词： | 自组装纳米膜 稀土 表征 |
| 文章编号： | 1004-4507(2005)10-0039-03 |
| 收稿时间： | 09 29 2005 12:00AM |
| 修稿时间： | 2005年9月29日 |
Preparation and Characterization of the Rare Earths Self-assembled Mononlayer by means of Self-assembly Process |
| |
| ZHU Da-chang,ZHU Jin-song.Preparation and Characterization of the Rare Earths Self-assembled Mononlayer by means of Self-assembly Process[J].Equipment for Electronic Products Marufacturing,2005,34(10):39-41. |
| |
| Authors: | ZHU Da-chang ZHU Jin-song |
| |
| Abstract: | Preparation the Rare Earths(La) Self-assembled Mononlayer by means of Self-assembly process. Characterize the surface of the Rare Earths Self-assembled Mononlayer by AFM. The result seems that the surface of this Mononlayer is dentise and the dim of the surface parcial is about 20～30 nm. The result of test with SEM is element of La. |
| |
| Keywords: | Self-assembly mononlayer Rare Earths AFM |
| 本文献已被 CNKI 万方数据 等数据库收录！ |
