| 中规模集成电路功能测试仪的设计 |
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| 引用本文： | 陈国强,吴国华,刘敬猛.中规模集成电路功能测试仪的设计[J].电子技术应用,2009,35(7). |
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| 作者姓名： | 陈国强 吴国华 刘敬猛 |
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| 作者单位： | 1. 杭州职业技术学院,浙江,杭州,310018
2. 北京航空航天大学,北京,100083 |
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| 摘 要： | 设计了一款针对学校实验室常用的中规模集成电路芯片的功能测试仪。测试仪的核心AT89C55单片机管理和控制整个测试流程,对测试数据进行处理、判断,并通过LCD、LED显示和指示其测试结果。详细介绍了测试仪的总体设计思路,给出了ADC0809、DAC0832、LM555、SG3524等芯片的详细测试电路图。
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| 关 键 词： | 中规模集成电路 功能测试 单片机 D/A转换器 |
Design of the testing instrument for MSIC |
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| CHEN Guo Qiang,WU Guo Hua,LIU Jing Meng.Design of the testing instrument for MSIC[J].Application of Electronic Technique,2009,35(7). |
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| Authors: | CHEN Guo Qiang WU Guo Hua LIU Jing Meng |
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| Abstract: | A testing instrument is designed for the electronic laboratory, which can be used for checking functions of some MSIC. The core unit of the instrument is the AT89C55 microcomputer, it controls the whole testing process, treats the data that have been got with testing ,and judges final results. Three buttons make the main parts of the input, they are used to reset the microcomputer and select the chip to under testing. The mainly output is the LCD screen, and there are also LED devices as a auxiliary indicators. This paper describes the overall design of the testing instrument, including the detailed testing circuits for ADC0809、DAC0832、LM555 and SG3524. |
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| Keywords: | MSIC function testing microcomputer DAC |
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