| 单一失效机理引起的元器件贮存寿命评价方法研究 |
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| 引用本文： | 刘建,恩云飞,黄云,杨丹. 单一失效机理引起的元器件贮存寿命评价方法研究[J]. 电子产品可靠性与环境试验, 2006, 24(4): 23-25 |
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| 作者姓名： | 刘建 恩云飞 黄云 杨丹 |
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| 作者单位： | 信息产业部电子第五研究所,广东,广州,510610;西安电子科技大学微电子学院,陕西,西安,710071;信息产业部电子第五研究所,广东,广州,510610 |
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| 摘 要： | 电子元器件长期贮存过程发生的失效是由多种失效机理共同作用的结果．以器件贮存寿命整体为基础的寿命评价难度很大。选择对器件贮存寿命影响最大的单一失效机理．以失效物理为基础．通过高加速应力试验进行寿命评价研究，获得的寿命可以较准确地反映器件真实的贮存寿命。单一失效机理贮存寿命的研究是元器件贮存可靠性工作的重要内容。
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| 关 键 词： | 元器件 贮存寿命 失效机理 |
| 文章编号： | 1672-5468(2006)04-0023-03 |
| 修稿时间： | 2006-04-17 |
Evaluation Technique for Long-term Storage Life of Electronic Components and Devices Caused by Single Failure Mechanism |
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| LIU Jian,EN Yun-fei,HUANG Yun,YANG Dan. Evaluation Technique for Long-term Storage Life of Electronic Components and Devices Caused by Single Failure Mechanism[J]. Electronic Product Reliability and Environmental Testing, 2006, 24(4): 23-25 |
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| Authors: | LIU Jian EN Yun-fei HUANG Yun YANG Dan |
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| Abstract: | It is very difficult to evaluate the long-term storage life of electronic components and devices,because of the interaction of multi failure mechanisms.It is believed that relatively valid storage life of actual components can be achieved by selecting the dominated single failure mechanism and evaluating the storage life through high accelerating test. |
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| Keywords: | electronic components storage life failure mechanism |
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