Fault diagnosis of a logical circuit by use of a pseudorandom signal and a neural network |
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Authors: | H Kashiwagi |
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Affiliation: | (1) Department of Mechanical Engineering, Faculty of Engineering, Kumamoto University, 860 Kumamoto, Japan |
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Abstract: | This paper describes a new method of pseudorandom testing of a digital circuit by use of a correlation method and a neural
network. The authors have recently proposed a new method of fault diagnosis in a logical circuit by applying a pseudorandom
M-sequence to the circuit under test, calculating the cross-correlation function between the input and the output, and comparing
the cross-correlation functions with the references. This method, called the M-sequence correlation (MSEC) method, is further
extended by using a neural network in order not only to detect the existence of faults, but also to find the place or location
of the faults. The authors investigated the effects of using parts of the fault patterns to train the neural network to be
able to detect faults. It is shown that more than 95% of faults can be detected even when only 60% of the possible training
data are used. |
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Keywords: | Fault diagnosis Pseudorandom signal M-sequence Correlation function Neural network |
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