首页 | 本学科首页   官方微博 | 高级检索  
     


Bayesian reliability demonstration for failure-free periods
Authors:F.P.A. Coolen   P. Coolen-Schrijner  M. Rahrouh
Affiliation:Department of Mathematical Sciences, Science Laboratories, University of Durham, South Road, Durham, DH1 3LE, UK
Abstract:We study sample sizes for testing as required for Bayesian reliability demonstration in terms of failure-free periods after testing, under the assumption that tests lead to zero failures. For the process after testing, we consider both deterministic and random numbers of tasks, including tasks arriving as Poisson processes. It turns out that the deterministic case is worst in the sense that it requires most tasks to be tested. We consider such reliability demonstration for a single type of task, as well as for multiple types of tasks to be performed by one system. We also consider the situation, where tests of different types of tasks may have different costs, aiming at minimal expected total costs, assuming that failure in the process would be catastrophic, in the sense that the process would be discontinued. Generally, these inferences are very sensitive to the choice of prior distribution, so one must be very careful with interpretation of non-informativeness of priors.
Keywords:Costs of testing   Non-informative prior distributions   Multiple tasks   Zero-failure tests
本文献已被 ScienceDirect 等数据库收录!
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号