微焦点X射线分层成像无损检测方法

对薄层结构的复合材料及多层电路板进程密度分布情况有分层成像研究。提出一种新的成像方法，即在现有微焦点X辐射成像系统的基础上，采用一种特殊的摆动式扫描方式，非线性的层面合成可以仅仅从很少的投影中重建物体，该法具有扫描速度快、算法简单、时性好等特点，适于多层大面积复合材料以及多层电路板的快速成像检测。

MICROFOCUS X-RAY LAMINOGRAPHY

The inspection of the flat components with complex structures and printed circuit board(PCB) is an important application of nondestructive testing and requires sophisticated nondestructive testing methods. Based on the microfocus X ray radiation imaging system, a new reconstruction method has been put forward. The objects can be analyzed by using computed laminography(CL) which requires a simple swing of the object inspected. The object is irradiated by the X ray source under different angles. Image processing can be applied in combination with the multi plane reconstruction for resolution and contrast enhancement. Linear reconstruction algorithm is based on the filtered or unfiltered back projection or averaging method respectively. Non linear reconstruction can be derived from the methods for object tracing.