| 基于STM32的Flash存储器坏块自动检测 |
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| 引用本文： | 张亚辉,马胜前.基于STM32的Flash存储器坏块自动检测[J].计算机系统应用,2013,22(6):209-211,215. |
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| 作者姓名： | 张亚辉 马胜前 |
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| 作者单位： | 西北师范大学物理与电子工程学院, 兰州 730070;西北师范大学物理与电子工程学院, 兰州 730070 |
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| 基金项目： | 国家自然科学基金(61162017);甘肃省教育厅研究生导师项目(1101-03) |
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| 摘 要： | 针对Nand Flash存储器存在坏块的问题, 提出一种基于STM32的Flash存储器坏块自动检测方法, 通过STM32内部可变静态存储控制器, 发出相应的数据、地址、控制信号, 在不增加外部器件的情况下, 快速访问Flash存储器, 并给出了部分硬件电路和C语言编写的程序代码. 该设计已成功实现自动检测Flash坏块的功能; 操作简单、检测速度快、准确率高; 并能读取Flash的ID号检测Flash性能, 同时能够存储和读取2GB数据.
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| 关 键 词： | Nand Flash 自动检测 STM32 可变静态存储控制器 串口通讯 |
| 收稿时间： | 2012/11/26 0:00:00 |
| 修稿时间： | 2013/1/16 0:00:00 |
Auto Detection of Invalid Block of Flash Memory Based on STM32 |
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| ZHANG Ya-Hui and MA Sheng-Qian.Auto Detection of Invalid Block of Flash Memory Based on STM32[J].Computer Systems& Applications,2013,22(6):209-211,215. |
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| Authors: | ZHANG Ya-Hui and MA Sheng-Qian |
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| Affiliation: | College of Physics and Electronic Engineering, Northwest Normal University, Lanzhou 730070, China;College of Physics and Electronic Engineering, Northwest Normal University, Lanzhou 730070, China |
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| Abstract: | According to Nand Flash memory bad block problem, this paper proposed a automatic check scheme to deal with bad block based on STM32. Without increasing the external device, through its internal flexible static memory controller, sends the corresponding data, address, control signals, to rapid access Flash memory. Its part circuit schematic diagram and C language program code was introduced. The design has been successfully realized the function of automatic checking the invalid block finally, and has the advantages of simple operation, fast detection speed, high accuracy rate, and can read the ID number of Flash to get the performance of the memory. And the design also can write and read 2GB data. |
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| Keywords: | Nand Flash automatic detection STM32 Flexible Static Memory Controller(FSMC) serial communication |
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