Frequency-dependent characteristics of thick microstrip lines in lossy multilayered dielectric media |
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| Authors: | J. R. Souza |
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| Affiliation: | 1. Center for Telecommunication Studies-CETUC, Pontifical Catholic University of Rio de Janeiro-PUC/Rio, Rua Marques de Sāo Vicente, 225, 22453-900, Rio de Janeiro-RJ, Brazil
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| Abstract: | The Spectral Domain Approach (SDA) is used for a rigorous full-wave analysis of thick microstrip lines embedded in lossy multilayered dielectric media. The effects of the conductor thickness on the propagation constant and characteristic impedance are investigated. |
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