| 用X射线测定金属晶粒度的新计算方法 |
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| 引用本文： | 蒋正行,李玉昌,刘国妹. 用X射线测定金属晶粒度的新计算方法[J]. 河北工业大学学报, 1992, 0(4) |
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| 作者姓名： | 蒋正行 李玉昌 刘国妹 |
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| 作者单位： | 河北工学院材料系，河北工学院材料系，河北工学院材料系 |
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| 摘 要： | 本文提出了一个借助于 X 射线测定金属晶粒度的新计算方法.在本文中,由 K_αX 射线产生的衍射线被认为是由 K_α_1和 K_α_2X 射线产生的衍射线的综合结果.如果用计算半高宽度 B_c 来代替衍射线的半高宽度 B,那么计算待测金属的晶粒度就变得容易了.与传统方法相比,新方法所得结果约小15%.新方法具有计算简单,不用标准试样的优点.当需要大致估计金属晶粒度时,新方法是有价值的.
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| 关 键 词： | X 射线衍射 晶粒度 半高宽度 计算半高宽度 标准试样 |
The New Calculating Method Used for Measuring the Grain Size of Metal by X-rays |
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| Jiang Zhengxing Li Yuchang Liu Guomei. The New Calculating Method Used for Measuring the Grain Size of Metal by X-rays[J]. Journal of Hebei University of Technology, 1992, 0(4) |
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| Authors: | Jiang Zhengxing Li Yuchang Liu Guomei |
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| Affiliation: | Jiang Zhengxing Li Yuchang Liu Guomei |
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| Abstract: | In this paper,a new calculating method used for measuring the grain size of metal by X-rays has been developed in which the diffraction line produced by K_a X-rays is considered as the comprehensive results of the diffraction lines of Ka_1 and Ka_2 X-rays.If the width of half height of the diffraction Iine B is replaced by so called the calculating width of half height Bc.It Will be very easy to calculate the grain size of metal waited for measuring.The res- ults calculated by this method in comparison with that of the traditional one is less about 15 percent.The new method has advantages that the calculating is simple without using standard specimen.It is valuable when the grain size of metal is estimated approximately. |
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| Keywords: | Diffraction of X-rays Grain size Widih of half height Calculating width of half height Standard specimen |
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