| ICP-MS反应池技术应用于高纯钨中痕量K、Ca、Fe和Si的测定研究 |
| |
| 引用本文： | 王长华.ICP-MS反应池技术应用于高纯钨中痕量K、Ca、Fe和Si的测定研究[J].质谱学报,2008,29(Z1):62-63. |
| |
| 作者姓名： | 王长华 |
| |
| 作者单位： | 北京有色金属研究总院，分析测试技术研究所，北京 100088 |
| |
| 摘 要： |
|
The Determination of Trace Kalium,Calcium, Iron and Silicon in High Purity Tungsten by ICP-MS Coupled with Octopole Reaction Cell System |
| |
| WANGChang-hua.The Determination of Trace Kalium,Calcium, Iron and Silicon in High Purity Tungsten by ICP-MS Coupled with Octopole Reaction Cell System[J].Journal of Chinese Mass Spectrometry Society,2008,29(Z1):62-63. |
| |
| Authors: | WANGChang-hua |
| |
| Affiliation: | Beijing General Research Institute for Non-ferrous metals, Beijing 100088, China |
| |
| Abstract: | A new method for the analysis of trace kalium, calcium, iron and silicon in high purity tungsten with reaction cell ICP-MS was studied. The four elements such as K, Ca, Fe and Si can all suffer the polyatomic ions interference and have the high background concentration in general ICP-MS determination. Thus, the four elements cannot be determined directly with ICP-MS, if the interferences were not eliminated. The new technology (reaction cell ICP-MS) can clear the interferences and decrease the background concentration obviously. The trace K, Ca, Fe and Si in high tungsten were analyzed with this new technology, and the satisfied results were obtained. |
| |
| Keywords: | ICP-MS reactioncellsystem highpuritytungsten interference |
|
| 点击此处可从《质谱学报》浏览原始摘要信息 |
|
点击此处可从《质谱学报》下载全文 |
|
