| 一种步进应力加速寿命试验数理统计分析法 |
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| 引用本文： | 刘鸿雁.一种步进应力加速寿命试验数理统计分析法[J].固体电子学研究与进展,1983(3). |
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| 作者姓名： | 刘鸿雁 |
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| 摘 要： | 本文提出了处理步进应力加速寿命试验的“时间等效”数学模型,并用它把寿命分布服从对数正态分布(或威布尔分布)、有m步的一次步进应力加速寿命试验变为有m级应力的恒定应力加速寿命试验来分析处理.并且推导出了它们之间的变换计算公式.用本法处理质子轰击隔离WC56型砷化镓场效应管步进应力加速寿命试验,获得了满意的结果.
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An Analytic Method of the Step-Stress Accelerated Life Test |
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| Abstract: | This paper first presents "time equivalence" mathematcal mode that can treat a step-stress accelerated life test with m-step. The mode can transform the step-stress accelerated life test into a constant-stress accelerated life test for log-nomal or weibull distribution. The calculation formula is also induced in this paper.
The step-stress accelerated life test of WC56 GaAs power FET bombardment with proton has been calculated with the above method and the induced formula, and satisfactory results has been obtained. |
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