Design and simulation of a nanoelectronic single-electron universal Fredkin gate

A single-electron universal Fredkin gate (F-gate) is presented in this paper. Bits of information are represented by the presence or absence of single electrons at conducting islands. The logic operation of the F-gate as well as its AND, OR, and NOT operation is verified using simulation. The stability of its universal operation is analyzed using a Monte Carlo method. Stability analysis using free-energy diagrams and stability plots verified the correct and stable gate operation. The operation temperature of the single-electron Fredkin is expected to rise as dimensions of the circuit's conducting islands are reduced.