Small‐angle X‐ray scattering investigation of the deformation processes in the amorphous phase of high density polyethylene

In situ small‐angle X‐ray scattering of high density polyethylene under uni‐axial tensile test was used for investigating the deformation at the scale of the periodic crystalline–amorphous nano‐structure. The more or less uniform elastic straining of the rubbery amorphous layers is discussed in terms of mechanically active intercrystalline tie chains. Correlation is made with the long‐term use properties. It is concluded that this approach is a powerful means to assess the mechanical efficiency of tie molecules. Copyright © 2004 Society of Chemical Industry