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模拟集成电路的测试与故障检测技术
引用本文:王志华.模拟集成电路的测试与故障检测技术[J].电子学报,1995,23(10):81-85,31.
作者姓名:王志华
作者单位:清华大学电子工程系
摘    要:本文综述了模拟集成电路的测试及故障检测等有关问题,首先介绍面向性能的测试方法,然后讨论故障模型和面向故障的测试方法,在介绍了模拟集成电路的可测性设计技术之后,讨论了利用电源监测进行故障检测的方法。

关 键 词:集成电路  测试  故障检测  模拟集成电路

Testing and Fault Detecting of Analog Integrated Circuit
Wang Zhihua.Testing and Fault Detecting of Analog Integrated Circuit[J].Acta Electronica Sinica,1995,23(10):81-85,31.
Authors:Wang Zhihua
Abstract:The problems related to the testing and fault detecting of analog integrated circuits are reviewed. The specification oriented testing technique is introduced first. Then the fault model of analog intergated circuit and the fault oriented testing method are discussed. After the introduction of testability and the design for testability of analog integrated circurt,a new algorithm for the testing and fault detecting of analog integrated circuit based on the monitoring of power supply current is discussed in detail.
Keywords:Testing of integrated circuit  Fault detection  Analog integrated circuit  
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