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框架载片台打凹深度对塑封针孔的影响
引用本文:石海忠,陈巧凤,朱锦辉,贾红梅.框架载片台打凹深度对塑封针孔的影响[J].电子与封装,2011,11(11):1-3,17.
作者姓名:石海忠  陈巧凤  朱锦辉  贾红梅
作者单位:南通富士通微电子股份有限公司,江苏南通,226006
摘    要:圆片制造技术的不断提升有效缓解了单位芯片的成本压力,同样功能的芯片尺寸越来越小,封装工艺也迫切面临提升的要求,尤其是小芯片极易在塑封工序产生背面针孔等方面的问题,这对塑封工艺提出了新的挑战。文中针对小芯片在塑封工艺中产生针孔的原理进行了深入分析,重点通过一系列试验改善针孔发生的比例,其中框架载片台打凹深度对针孔发生有重...

关 键 词:载片台  打凹深度  小芯片  模腔  针孔

Analysis on the Influence of the Downset of Die Pad on Pinhole
SHI Hai-zhong,CHEN Qiao-feng,ZHU Jin-hui,JIA Hong-mei.Analysis on the Influence of the Downset of Die Pad on Pinhole[J].Electronics & Packaging,2011,11(11):1-3,17.
Authors:SHI Hai-zhong  CHEN Qiao-feng  ZHU Jin-hui  JIA Hong-mei
Affiliation:SHI Hai-zhong,CHEN Qiao-feng,ZHU Jin-hui,JIA Hong-mei(Nantong Fujitsu Microelectronics CO.,LTD,Nantong 226006,China)
Abstract:The continuous improvement of the wafer technology effectively relieves the cost pressure of unit die.The die size with a homogeneous function becomes more and more small and the assembly technology is facing an urgent requirement for improvement.Especially on the backside pinhole issue of the small dies at molding process,which puts forward the new challenge to the molding technology.A deep analysis in this article elaborates the principle on the pinhole issue at molding process;mainly reduce the pinhole o...
Keywords:die pad  down set  small dies  cavity  pinhole  
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