GaAs-MeSFET for digital application |
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Authors: | E Kohn |
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Affiliation: | Institut fur Halbleitertechnik an der RWTH Aachen/Sonderforschungsbereich 56, “Festkorperelektronik”, D-51 Aachen, Templergraben 55, West Germany |
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Abstract: | To meet the requirement of defined input and output levels of digital devices, the FET-fabrication process was designed to include the adjustment of the pinch-off voltage in a notched channel structure. The notch is produced by a d.c.-sputter etch, immediately followed by the evaporation of the metals for the Schottky gate. Schottky diodes made from CrAgCrGaAs or AlCrGaAs and annealed at 400°C in forming gas showed a high current stability at forward bias. This allows positive gate bias operation of the FET, which results in pulse sharpening and pulse recovery. A 40 ps switching time was measured including 50% pulse sharpening. |
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