Crystal structure,far-infrared spectra,and microwave dielectric properties of bazirite-type BaZr(Si1-xGex)3O9 ceramics

Novel BaZr(Si_1-xGe_x)₃O₉ (0 ≤ x ≤ 1.0) microwave dielectric ceramics were prepared by solid-state reaction sintering at 1200–1450 °C for 5 h Ge⁴⁺ ions occupied the Si⁴⁺ positions, and BaZr(Si_1-xGe_x)₃O₉ solid solutions were obtained. The BaZr(Si_1-xGe_x)₃O₉ (0 ≤ x ≤ 1.0) ceramics exhibited hexagonal structures with P-6c2 space groups and octahedral layers and [Si/Ge₃O₉]^6- rings. Owing to these structural characteristics, the ceramics exhibited low permittivity. With an increase in x, the relative permittivity (ε_r) values of the BaZr(Si_1-xGe_x)₃O₉ (0 ≤ x ≤ 1.0) ceramics increased from 7.68 (x = 0) to 9.45 (x = 1.0), while their quality factor (Q × f) values first increased and then decreased. The Q × f value (10,300 GHz at 13.43 GHz) of the BaZrSi₃O₉ (x = 0) ceramic improved with the substitution of Si⁴⁺ by Ge⁴⁺. A high Q × f value (36,100 GHz at 13.81 GHz) was obtained for the BaZr(Si_1-xGe_x)₃O₉ (x = 0.2) ceramic, and the Q × f values of the BaZr(Si_1-xGe_x)₃O₉ ceramics could be controlled by varying the Si/Ge-site bond valence. The temperature coefficient of resonance frequency (τ_f) values of the BaZr(Si_1-xGe_x)₃O₉ ceramics were mainly affected by the O2-site bond valence, and the optimum τ_f value (?22.8 ppm/°C) was achieved for the BaZrSi₃O₉ ceramic. The BaZr(Si_1-xGe_x)₃O₉ (x = 0.2) ceramic showed the optimum microwave dielectric properties (ε_r = 8.36, Q × f = 36,100 GHz at 13.81 GHz, and τ_f = ?34.5 ppm/°C).