Dielectric and photoconducting properties of Ga2Te3 and In2Te3 crystals

Single crystals of defect III–VI semiconductors Ga₂Te₃ and In₂Te₃ have been grown by the Bridgman method. Capacitance vs frequency measurements have been carried out from which the low frequency dielectric constants ?₅ have been determined to be 10.95 ± 0.26 and 12.3 ± 0.13 respectively. These values are compared with the high-frequency dielectric constants ?₆₀ calculated from the Phillips' model. Dark conductivity and photoconductivity have been studied as a function of annealing upto 210°C, maxinum photosensitivity being obtained for both crystals for T_anneal = 80°C. This behaviour has been related to lattice ordering through x-ray diffraction studies. Measurements of photo conductive gain indicate carrier life-times of 2 × 10^?4s and 5 × 10^?4s respectively at room-temperature.