| 基于AT90系列单片机的过载存储测试系统 |
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| 引用本文： | 汪韧冬,白玉贤,万丽珍.基于AT90系列单片机的过载存储测试系统[J].兵工自动化,2002,21(1):28-30. |
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| 作者姓名： | 汪韧冬 白玉贤 万丽珍 |
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| 作者单位： | 北京理工大学机电工程学院,北京,100081 |
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| 摘 要： | 基于ATMEL 90系列单片机AT90S8515为系统控制器的过载存储测试仪,实现了野外过载存储系统的小型化.该过载存储测试仪由传感器、电荷放大器、模数转换接口、数据存储器及单片机系统组成.关键技术是解决物理寻址扩展以满足存储容量,及采样周期中完成模数转换和结果存储.其软件系统以C/C++为编程工具,包括写入单片机存储器工作程序与其它计算机的通讯,以及其它装载计算机对存储测试系统的处理.
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| 关 键 词： | 测试系统 单片机 过载存储 |
| 文章编号： | 1006-1576(2002)01-0028-03 |
| 修稿时间： | 2000年9月17日 |
An Acceleration Memory Testing System Based on AT90 MCU |
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| WANG Ren-dong,BAI Yu-xian,WAN Li-zhen.An Acceleration Memory Testing System Based on AT90 MCU[J].Ordnance Industry Automation,2002,21(1):28-30. |
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| Authors: | WANG Ren-dong BAI Yu-xian WAN Li-zhen |
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| Abstract: | The minmization of the acceleration memory testing system is realized by an acceleration memory testing system applying AT90 MCU. The testing system consists of the pressure sensor, the charge amplifier, the interface of A/D, the data memory and AT90 MCU. The way to extend the accessing area of physical address is solved. In this system, the course of A/D exchanging and data record is completed during the sample period. The software system includes the software embedded in MCU and the data communication program between MCU and PCs, etc. |
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| Keywords: | Testing system MCU Acceleration memory |
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