| 光电耦合器电离辐射损伤噪声相关性模型 |
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| 引用本文： | 林丽艳,杜磊,包军林,何亮. 光电耦合器电离辐射损伤噪声相关性模型[J]. 电子科技, 2010, 23(3): 50-52 |
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| 作者姓名： | 林丽艳 杜磊 包军林 何亮 |
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| 作者单位： | （1西安电子科技大学大学 技术物理学院,陕西 西安710071;2西安电子科技大学大学 微电子学院,陕西 西安710071） |
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| 摘 要： | 在总结光电耦合器噪声产生机制的基础上,建立光电耦合器电离辐射损伤1/f噪声相关性模型,并通过辐照实验验证了模型的正确性。该模型全面分析了光电耦合器的电离辐射损伤,为噪声参量用于光电耦合器电离辐射损伤表征提供了理论依据。
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| 关 键 词： | 噪声 光电耦合器 模型 |
A Model for Ionizing Radiation Damage Correlating with Noise in Optoelectronic Coupled Devices |
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| Lin Liyan,Du Lei,Bao Junlin,He Liang. A Model for Ionizing Radiation Damage Correlating with Noise in Optoelectronic Coupled Devices[J]. Electronic Science and Technology, 2010, 23(3): 50-52 |
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| Authors: | Lin Liyan Du Lei Bao Junlin He Liang |
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| Affiliation: | (1School of Technical Physics,Xidian University,Xian 710071,China;2School of Microelectronics,Xidian University,Xian 710071,China) |
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| Abstract: | Defects generated by ionizing radiation damage in optoelectronic coupled devices(OCDs) is the origin of noise.Based on a summary of the noise mechanism in OCDs,a model of ionizing radiation damage correlating with 1/f noise in OCDs has been established.The experimental results agree well with the proposed model.The model analyzes the mechanism and provides the noise representation theory for ionizing radiation damage in OCDs. |
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| Keywords: | noise OCDs model |
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