Reduction dependent wetting properties of graphene oxide |
| |
| Affiliation: | 1. Dipartimento di Scienze Fisiche e Chimiche, Università dell’Aquila, Via Vetoio, 67100 L’Aquila, Italy;2. CNR-ISOF, Via Gobetti 101, 40129 Bologna, Italy;3. Laboratorio MIST.E-R, Via Gobetti 101, 40129 Bologna, Italy;4. CNR-SPIN UOS L’Aquila, Via Vetoio, 67100 L’Aquila, Italy;1. Polytechnic Institute of New York University, Six MetroTech Center, Brooklyn, NY 11201, USA;2. Faculty of Science and Technology, Keio University, Yokohama 223-8522, Japan;3. Membrane Technology and Research, Inc., 39630 Eureka Drive, Newark, CA 94560, USA;1. Institute of Chemical Process Engineering, University of Stuttgart, Böblinger Straße 78, D-70199 Stuttgart, Germany;2. Institute of Theoretical Chemistry, University of Stuttgart, Pfaffenwaldring 55, D-70569 Stuttgart, Germany;3. North-West University, Chemical Resource Beneficiation, Potchefstroom 2520, South Africa;1. Institute of Nuclear and New Energy Technology, Tsinghua University, Beijing 100084, China;2. State Key Laboratory of Automotive Safety and Energy, Tsinghua University, Beijing 100084, China;3. Beijing Key Lab of Fine Ceramics, Tsinghua University, Beijing 100084, China;1. College of Chemistry and Chemical Engineering, Fujian Normal University, Fuzhou 350007, PR China;2. Fujian Key Laboratory of Polymer Materials, Fuzhou 350007, PR China;3. Fujian Provincial Key Laboratory of Advanced Materials Oriented Chemical Engineering, Fuzhou 350007, PR China |
| |
| Abstract: | This study reports contact angle measurements of standard, diol and aromatic solvents on graphene oxide thin films thermally reduced in ultra-high vacuum up to 900 °C. The films were chemically and morphologically characterized using respectively X-ray photoemission spectroscopy and atomic force microscopy. The characterization shows that the wetting occurs in the chemically heterogeneous regime, namely the surface roughness (3 nm) does not influence the wetting properties of the samples. Zisman, Owens–Wendt and Neumann methods have been applied in order to calculate the surface free energy of the thin films showing that the Owens–Wendt method best fit the data trends. The surface free energy varies from 51 mN/m (pristine graphene oxide) to 39 mN/m (900 °C reduced graphene oxide). A correlation between the surface chemical composition, the surface free energy and its polar and dispersive components is reported, giving a rationale to the wetting properties of graphene oxide and reduced graphene oxide. |
| |
| Keywords: | |
| 本文献已被 ScienceDirect 等数据库收录！ |
|
