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Core-level X-ray photoemission spectral shift through the successive phase transitions in layered TlInS2 |
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| Authors: | Takahiko Ishizu YongGu Shim Nazim Mamedov Kouichi Ichikawa |
| Affiliation: | a Department of Mathematical Sciences, Graduate School of Engineering, Osaka Prefecture University, Sakai 599-8531, Japan b Department of Physics and Electronics, Graduate School of Engineering, Osaka Prefecture University, Sakai 599-8531, Japan c Department of Electrical, Electronics and Computer Engineering, Chiba Institute of Technology, Narashino 275-0016, Japan d Institute of Physics, Azerbaijan National Academy of Science, Baku, AZ-1143, Azerbaijan |
| Abstract: | Temperature-dependent change in core-level electronic structures of the layered semiconductor-ferroelectric TlInS2 with incommensurate phase has been investigated by means of X-ray photoemission spectroscopy. The temperature dependence of the relative peak position for each core level (Tl 4f, In 3d and S 2p) is found to differ very much in the regions bordering each other at the normal-incommensurate phase transition point of 218 K. The obtained data suggest that the charge distribution in TlInS2 dramatically changes upon passing from the normal phase (T > 218 K) to the spatially modulated incommensurate phase (T < 218 K). |
| Keywords: | X-ray photoemission spectroscopy (XPS) TlInS2 Phase transition Incommensurate phase |
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