| 基于PIC单片机控制的RLC智能测量仪 |
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| 引用本文： | 杨继生,刘芬.基于PIC单片机控制的RLC智能测量仪[J].现代电子技术,2007,30(15):131-132,138. |
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| 作者姓名： | 杨继生 刘芬 |
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| 作者单位： | 1. 天津第五机床厂,天津,300222
2. 天津工程师范学院,天津,300222 |
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| 摘 要： | 为了精确测量分立元件的参数,介绍了一种由PIC单片机控制的RLC智能测量仪。该测量仪利用PIC单片机内置的A/D转换模块对信号进行采样,并采用正交采样算法对数据进行处理从而得出待测元件的参数值。测量结果表明,他具有较高的精度和分辨率,可广泛应用于对元器件参数进行精确测量与分选。与传统的仪表相比,该测量仪还具有智能识别、量程自动转换、在线测量等优点,因此他具有重要的实用价值。
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| 关 键 词： | 正交采样 智能识别 在线测量 量程自动转换 |
| 文章编号： | 1004-373X（2007）15-131-02 |
| 收稿时间： | 2007-04-19 |
| 修稿时间： | 2007-04-19 |
Design of RLC Measuring Machine Based on PIC |
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| YANG Jisheng,LIU Fen.Design of RLC Measuring Machine Based on PIC[J].Modern Electronic Technique,2007,30(15):131-132,138. |
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| Authors: | YANG Jisheng LIU Fen |
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| Affiliation: | Tianjin Fifth Machine Tool Works of China,Tianjin,300222,China;2. Tianjin University of Technology Edueation,Tianjin,300222,China |
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| Abstract: | The paper introduces a kind of system of hardware frame and software design,which is mainly to measure RLC parameter by using PIC controlling.Signals can be sampled with A/D converter module embedded PIC single chip and a quadrature sampling approach is adopted to process data and measure RLC parameter.The system with its advantages such as high integrity,intellectuality and in-circuit measuring with the intelligent instrument develop tendency,and takes on a sure practice significance and wide-range application. |
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| Keywords: | quadrature sampling intellectual identification in-circuit measuring range automatic switching |
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