Data-driven self-timed RSFQ high-speed test system |
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| Authors: | Deng Z.J. Yoshikawa N. Whiteley S.R. Van Duzer T. |
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| Affiliation: | Dept. of Electr. Eng. & Comput. Sci., California Univ., Berkeley, CA; |
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| Abstract: | Functional testing of rapid single-flux-quantum (RSFQ) logic circuits at high speed is necessary to further optimize circuit design, but it is not easy to do off-chip testing because of the high speed and small amplitude of SFQ pulses. This paper will present the design and test results of an 20 Gb/s bit-by-bit on-chip high-speed digital test system based on data-driven self-timed (DDST) circuits |
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