Polymers of α-substituted benzyl methacrylates as a new type of electron-beam resist |
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Authors: | Koichi Hatada Tatsuki Kitayama Shigeru Danjo Yutaka Tsubokura Heimei Yuki Kazuyuki Moriwaki Hiroaki Aritome Susumu Namba |
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Affiliation: | (1) Department of Chemistry, Faculty of Engineering Science, Osaka University, Toyonaka, 560 Osaka, Japan;(2) Department of Electrical Engineering, Faculty of Engineering Science, Osaka University, Toyonaka, 560 Osaka, Japan |
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Abstract: | Summary Polymer of α-substituted benzyl methacrylate was found to be used as a new type of positive electron-beam resist, which forms methacrylic acid units in the polymer chain on the exposure to electron-beam and can be developed using alkaline solution as a developer. The sensitivity was dependent on the bulkiness of the ester group and the number of ?-hydrogen atoms in the ester group. The sensitivity and γ-value of atactic poly(α, α-dimethylbenzyl methacrylate) were improved by a factor of more than three over poly (methyl methacrylate). |
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