| 电子快门与CCD图像传感器抗晕的研究 |
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| 引用本文： | 武利翻.电子快门与CCD图像传感器抗晕的研究[J].电子科技,2010,23(8):18-19,24. |
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| 作者姓名： | 武利翻 |
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| 作者单位： | (西安邮电学院 电子工程学院,陕西 西安 710121) |
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| 摘 要： | 为了抑制CCD图像传感器在强光照射时出现光晕和弥散现象,运用半导体器件数值模拟软件MEDICI,对建立的纵向抗晕CCD器件模拟结构进行数值计算,并分析1 PW层硼掺杂浓度参数对CCD纵向抗晕能力的影响,并对CCD纵向抗晕结构进行优化结构。而电子快门就是利用纵向抗晕的工作原理而发展的。
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| 关 键 词： | CCD 光晕 抗晕 器件仿真 |
Research on and Simulation of A CCD Image Sensor with a Vertical Anti-blooming Structure |
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| Wu Lifan.Research on and Simulation of A CCD Image Sensor with a Vertical Anti-blooming Structure[J].Electronic Science and Technology,2010,23(8):18-19,24. |
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| Authors: | Wu Lifan |
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| Affiliation: | (School of Electronic Engineering,Xi'an University of Post & Telecommunications,Xi'an 710121,China) |
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| Abstract: | By using MEDICI,A CCD device simulation structure with vertical anti-blooming is calculated numerically to eliminate blooming and smear in the CCD image sensor in its exposure to intense sunlight.The effect of the 1PW impurity concentration parameter on the vertical anti-blooming ability of CCD is analyzed and the vertical anti-blooming structure of CCD is optimized.The electronic shutter is developed by the work principle of vertical anti-blooming. |
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| Keywords: | CCD |
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