| Abstract: | Experimental observations have been made of the fringe contrast which appears at the terminating edges of thin objects in defocused, scanning-transmission electron micrographs. In general only a single bright fringe is present and the displacement and width of this fringe was found to vary linearly with defocus, indicating the contrast does not result from simple-Fresnel diffraction. A model for this contrast, based on the refraction of incident electrons by the object edge, is shown to explain the observed results. |
