|
|||||
|
|
Time-To-Latch-Up investigation of SCR devices as ESD protection structures on 65 nm technology platform |
|
| Authors: | A. Tazzoli M. Cordoni P. Colombo C. Bergonzoni G. Meneghesso |
| Affiliation: | 1. Department of Chemistry, University of Kentucky, Lexington, KY 40506-0055, USA;2. Department of Pediatrics, University of Kentucky, Lexington, KY 40536, USA;3. Markey Cancer Center, University of Kentucky, Lexington, KY 40536, USA;4. Department of Toxicology and Cancer Biology, University of Kentucky, Lexington, KY 40536-0305, USA;5. Department of Radiation Medicine, University of Kentucky, Lexington, KY 40506-9983, USA;6. Sanders-Brown Center on Aging, University of Kentucky, Lexington, KY 40506-0055, USA |
| Abstract: | The purpose of this work was to study the influence of different layout parameters on the electrical performances and Time-To-Latch-Up (TTLU) by means of the injection of substrate current on SCR devices to be used as ESD protection structures for the 65 nm Flash memory technology platform. Low (1.2 V) and high (5.0 V) voltage class devices were studied in DC and 100 ns TLP regimes, and an ad hoc setup was developed to investigate TTLU as a function of the injected current needed to Latch-Up HV-SCRs. Results were then compared to 2D device simulations. |
| Keywords: | |
| 本文献已被 ScienceDirect 等数据库收录！ | |