Combining Functional and Structural Approaches for Switched-Current Circuit Testing

This paper aims at defining an efficient test strategy for switched-current circuit testing. Taking into account the specificity of these circuits, we propose an original structural test technique as an alternative to traditionally-used functional verification. This technique is validated both at the cell and block levels. Test results demonstrate that a high fault coverage can be achieved with a low cost test procedure. A mixed strategy combining benefits of functional and structural approaches is derived.