High-pressure,high-temperature study of GeS2 and GeSe2 |
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Authors: | L. F. Kulikova L. M. Lityagina I. P. Zibrov T. I. Dyuzheva N. A. Nikolaev V. V. Brazhkin |
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Affiliation: | 1. Vereshchagin Institute of High-Pressure Physics, Russian Academy of Sciences, Kaluzhskoe sh. 14, Troitsk, Moscow, 142190, Russia
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Abstract: | Phase transitions of the GeX2 (X = S, Se) dichalcogenides have been studied at pressures of up to p ? 8 GPa and temperatures from 675 to 1375 K, and portions of their p-T phase diagrams have been constructed using our and previous experimental data. The crystal structure of the GeS2-III phase has been refined by the Rietveld method (HgI2 structure, P42/nmc, a = 3.46906(2) Å, c = 10.9745(1) Å, Z = 2, D x = 3.438 g/cm3, R = 0.06). GeSe2-III crystals have been grown for the first time at p ? 7 GPa in the temperature range 875–1275 K. The unit-cell parameters of GeSe2-III (hex) are a = 6.468 ± 0.004 Å and c = 24.49 ± 0.10 Å (D meas = 5.16 g/cm3, D x = 5.18 g/cm3, Z = 12). |
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