Influence of frequency tuning and double-frequency heating on ions extracted from an electron cyclotron resonance ion source

The electromagnetic field within the plasma chamber of an electron cyclotron resonance ion source (ECRIS) and the properties of the plasma waves affect the plasma properties and ion beam production. We have experimentally investigated the "frequency tuning effect" and "double frequency heating" on the CAPRICE ECRIS device. A traveling wave tube amplifier, two microwave sweep generators, and a dedicated experimental set-up were used to carry out experiments in the 12.5-16.5 GHz frequency range. During the frequency sweeps the evolution of the intensity and shape of the extracted argon beam were measured together with the microwave reflection coefficient. A range of different ion source parameter settings was used. Here we describe these experiments and the resultant improved understanding of these operational modes of the ECR ion source.