一种抗老化消除浮空点并自锁存的老化预测传感器

随着集成电路芯片制造工艺进入纳米阶段,电路可靠性问题变得越来越严重,以负偏置温度不稳定性效应为代表的电路老化也逐渐成为影响其性能的重要因素.基于老化预测的精确性和传感器功能的多样性,提出了一种抗老化、可编程的老化预测传感器.其中稳定性检测器部分利用反馈回路解决了浮空点问题,同时整合了锁存器部分,实现了对老化预测结果的自动锁存,从而增加了老化预测的精确度,减小了一定的面积开销.最后通过HSPICE模拟器仿真验证了该传感器的优越性,且与经典结构相比降低了约21.43％的面积开销.

An Anti-Aging,Floating Point Avoiding and Self-Locking Aging Prediction Sensor

With the integrated circuit chip manufacturing process entering the nanometer stage,it becomes more and more serious for the reliability of the circuit,and circuit aging represented by the negative bias temperature instability effect has gradually become an important factor affecting its performance.Based on the accuracy of aging prediction and the diversity of sensor function,an anti-aging and programmable aging prediction sensor was proposed.The floating point problem was eliminated by the stability checker part by means of the feedback circuit.Meanwhile,the latch part was integrated and the aging prediction result could be automatically latched,thus improving the accuracy of aging prediction and reducing a certain area overhead.Finally,the superiority of the sensor was verified by the simulation of HSPICE simulator.The area overhead is reduced by about 21.43％ compared with the classical structure.