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用于开发车辆MCU的变参数电机硬件在环测试方法
引用本文:李金,吴帅军,石林龙. 用于开发车辆MCU的变参数电机硬件在环测试方法[J]. 电机与控制应用, 2020, 47(7): 79-86
作者姓名:李金  吴帅军  石林龙
作者单位:上海科梁信息工程股份有限公司,上海200233
摘    要:分析了电机驱动控制器硬件在环(HIL)仿真技术的关键点,基于NI平台和OPAL-RT电机和电力电子仿真工具包建立了完整的用于开发、测试和验证车辆微控制单元(MCU)的HIL仿真测试系统,功能涵盖试验配置和管理、模型自定义、非线性特征定义和在线调参等。详细介绍了试验中各部分模型的建立方法。结合电机标定测试工况,分别基于电机定参数模型和变参数模型进行仿真测试。测试结果表明,变参数电机模型的试验结果与真实台架的测试结果近似,误差小于15%。通过软件故障注入功能,方便地实现了功率管失效、桥臂直通和相间短路等电气故障注入测试。

关 键 词:电机驱动控制器; 硬件在环; 实时仿真; MCU; 电气故障注入
收稿时间:2020-04-14
修稿时间:2020-05-22

HIL Test Method Based on Variable Parameter Motor Model for Developing Automotive MCU
LI Jin,WU Shuaijun,SHI Linlong. HIL Test Method Based on Variable Parameter Motor Model for Developing Automotive MCU[J]. Electric Machines & Control Application, 2020, 47(7): 79-86
Authors:LI Jin  WU Shuaijun  SHI Linlong
Affiliation:Shanghai Keliang Information Tech & Eng Co.,Ltd.,Shanghai 200233, China
Abstract:The key points of hardware-in-the-loop (HIL) simulation technology of the motor drive controllers are analyzed. Based on NI platform and OPAL-RT software package for motor and power electronic simulation, a well structured HIL simulation test system for developing, testing and verifying automotive micro controller unit (MCU) is established, providing complete functionalities including test management and configuration, customizing models, adding nonlinear features, online tuning and so forth. Detailed configuration methods of models of all parts are introduced respectively. On the basis of the motor calibration test, simulation tests with motor models of constant parameters and variable parameters are performed respectively. The test results of the variable parameter motor model are similar to those of the real bench test, with a relative error of less than 15%. Benefiting from software implemented fault injection, the fault injection tests of IGBT fault, shoot-through of bridge arm and interphase short circuit are conveniently realized.
Keywords:motor drive controller   hardware-in-the-loop (HIL)   real-time simulation   micro controller unit (MCU)   electrical fault injection
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