Effects of Stacking Scheme on Microwave Dielectric Characteristics of Ca(Mg1/3Nb2/3)O3–Ba(Zn1/3Nb2/3)O3 Layered Dielectric Resonators

Ca(Mg_1/3Nb_2/3)O₃ (CMN) and Ba(Zn_1/3Nb_2/3)O₃ (BZN) ceramic disks were stacked with three stacking schemes, designated as CMN/BZN, CMN/BZN/CMN, and BZN/CMN/BZN, to yield layered dielectric resonators, and the microwave dielectric characteristics were evaluated with the TE_01δ mode. Both experiments and finite element analysis showed that the microwave dielectric characteristics of the layered resonator were determined not only by the volume fraction of BZN but also by the stacking scheme. For each stacking scheme, a good combination of microwave dielectric characteristics with an effective dielectric constant of 34.33–34.52, a Q × f value of 58 800–62 080 GHz, and a near-zero temperature coefficient of resonant frequency could be achieved by adjusting the volume fraction of BZN. The effects of the stacking scheme on the microwave dielectric characteristics of the temperature-stable layered resonator were discussed by combining finite element analysis and dielectric composite models.