ZnO nanocrystalline thin films: a correlation of microstructural,optoelectronic properties |
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Authors: | V B Patil S G Pawar S L Patil S B Krupanidhi |
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Affiliation: | (1) Department of Physics, Solapur University, Solapur, M.S, India;(2) Materials Research Centre, Indian Institute of Science, Bangalore, India |
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Abstract: | The compositional, structural, microstructural, dc electrical conductivity and optical properties of undoped zinc oxide films
prepared by the sol–gel process using a spin-coating technique were investigated. The ZnO films were obtained by 5 cycle spin-coated
and dried zinc oxide films followed by annealing in air at 600 °C. The films deposited on the platinum coated silicon substrate
were crystallized in a hexagonal wurtzite form. The energy-dispersive X-ray (EDX) spectrometry shows Zn and O elements in
the products with an approximate molar ratio. TEM image of ZnO thin film shows that a grain of about 60–80 nm in size is really
an aggregate of many small crystallites of around 10–20 nm. Electron diffraction pattern shows that the ZnO films exhibited
hexagonal structure. The SEM micrograph showed that the films consist in nanocrystalline grains randomly distributed with
voids in different regions. The dc conductivity found in the range of 10−5–10−6 (Ω cm)−1. The optical study showed that the spectra for all samples give the transparency in the visible range. |
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