| 基于超深亚微米IC设计的信号完整性研究 |
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| 引用本文： | 王明虎,林大俊,杨依忠,梁齐. 基于超深亚微米IC设计的信号完整性研究[J]. 现代电子技术, 2004, 27(12): 22-24 |
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| 作者姓名： | 王明虎 林大俊 杨依忠 梁齐 |
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| 作者单位： | 合肥工业大学,安徽,合肥,230009 |
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| 摘 要： | 随着工艺尺寸的缩小，IC设计的两大趋势是设计更复杂和对产品的设计周期要求更苛刻。在超深亚微米IC设计中，设计的复杂性会导致SI(信号完整性)问题更加突出，从而会影响整个产品的设计周期。本文在此基础上提出了SI概念以及影响他的因素，并针对其两个主要影响因素crosstalk(串扰)和IR drop(IR压降)进行了分析讨论，并提出了解决的方案。
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| 关 键 词： | 信号完整性 串扰 IR压降 超深亚微米 |
| 文章编号： | 1004-373X(2004)12-022-03 |
| 修稿时间： | 2004-02-27 |
Research of Signal Integrity Based on UDSM IC Design |
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| WANG Minghu,LIN Dajun,YANG Yizhong,LIANG Qi. Research of Signal Integrity Based on UDSM IC Design[J]. Modern Electronic Technique, 2004, 27(12): 22-24 |
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| Authors: | WANG Minghu LIN Dajun YANG Yizhong LIANG Qi |
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| Abstract: | Along with the IC design migrating to Ultra deep submicron (UDSM) and its operation speed being faster, SI problem has become a serious challenge to ASIC and SoC design Crosstalk and IR drop are two dominant SI issues and have important impacts on circuit performance In this paper, the reasons of crosstalk and IR drop effect are discussed in detail Then their influences on timing are analyzed The methods to decrease these effects are proposed, too |
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| Keywords: | signal integrity crosstalk IR drop UDSM |
| 本文献已被 CNKI 维普 万方数据 等数据库收录！ |
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