| 新方法制备透射电镜粉末样品 |
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| 引用本文： | 李慧,张静武,李葵英. 新方法制备透射电镜粉末样品[J]. 现代科学仪器, 2001, 0(4): 55-56 |
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| 作者姓名： | 李慧 张静武 李葵英 |
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| 作者单位： | 燕山大学材料与化工学院 |
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| 摘 要： | 尝试一种新的方法制备了SiC粉末的透射电镜样品，并利用H－800型透射电子显微镜对SiC粉末样品进行了观察。
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| 关 键 词： | 透射电镜 碳化硅粉末 样品制备 |
| 修稿时间： | 2001-02-28 |
Preparation of TEM Powder Samples by a New Way |
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| Li Hui,Zhang Jingwu,Li Kuiying. Preparation of TEM Powder Samples by a New Way[J]. Modern Scientific Instruments, 2001, 0(4): 55-56 |
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| Authors: | Li Hui Zhang Jingwu Li Kuiying |
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| Abstract: | This article sets forth the preparation process of SiC powders TEM samples by a new way. Under H 800 Transmission Electron Microscope, TEM samples of SiC powders have been observed. |
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| Keywords: | SiC powders TEM sample Preparation and survey |
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