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Atomic data and spectral line intensities for Ar XI
Authors:E Landi  AK Bhatia
Affiliation:a ARTEP, Inc., Columbia, MD 21044, at Naval Research Laboratory, Washington, DC 20375, USA
b NASA/Goddard Space Flight Center, Greenbelt, MD 20771, USA
Abstract:Electron impact collision strengths, energy levels, oscillator strengths, and spontaneous radiative decay rates are calculated for Ar XI. The configurations used are 2s22p4, 2s2p5, 2p6, 2s22p33s, 2s22p33p, and 2s22p33d giving rise to 86 fine-structure levels in intermediate coupling. Collision strengths are calculated at five incident energies (30, 60, 90, 120, and 150 Ry) in the distorted wave approximation. Excitation rate coefficients are calculated as a function of electron temperature by assuming a Maxwellian electron velocity distribution. Using the excitation rate coefficients and the radiative transition rates, statistical equilibrium equations for level populations are solved at electron densities covering the range of 108-1014 cm−3 at an electron temperature of log Te (K) = 6.3, corresponding to the maximum abundance of Ar XI. Relative and absolute spectral line intensities are calculated, and their diagnostic relevance is discussed. This dataset will be made available in the next version of the CHIANTI database.
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