| Abstract: | The “Tanaka” method is one of several techniques that make it possible to obtain zone-axis electron diffraction patterns in a transmission electron microscope without the restriction in the field of view that limits normal convergent-beam diffraction patterns. The method employs a convergent-beam of electrons focused to a probe in a plane that does not coincide with the specimen. The selected area aperture can then be used to eliminate all but one of the diffracted beams to obtain the desired pattern. Practical details of operation and values of operating parameters are discussed. The Tanaka method is a useful addition to the techniques available to the electron microscopist, especially since no instrumental modification is required. |
