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A semiconductor electron current detector for the direct recording of electron microscopic diffraction images
Authors:H. Fuchs  M. Schuler
Affiliation:Universität des Saarlandes, Werkstoffwissenschaften/FB12.1, D-6600 Saarbrücken, FRG
Abstract:A semiconductor detector for the direct time-serial recording of electron microscopic diffraction images is presented. The recording method is described and the performance of the detector compared to that of a standard STEM scintillator/photomultiplier chain.
Keywords:
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