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基于89C52的二极管特性测试器的设计
引用本文:冯晓伟,李正生,王雷阳. 基于89C52的二极管特性测试器的设计[J]. 电子设计工程, 2011, 19(6): 50-52
作者姓名:冯晓伟  李正生  王雷阳
作者单位:第二炮兵工程学院101教研室,陕西,西安,710025
摘    要:利用单片机具有的智能程序控制的特点,设计了基于STC89C52单片机的二极管特性测试器,可对二极管一般特性进行快速测试。通过稳定线性电流源给二极管加载恒定电流,然后由高精度模数转换器测试其压降,以此为基础可判断二极管好坏、检测二极管极性和测试二极管伏安特性等,避免了用万用表测试只能测得极性而不知其特性这一缺点。可用于电子设计制作过程中对二极管进行快速测试,以确定被测二极管是否满足电路的设计要求。

关 键 词:二极管  特性  测试器  单片机  电流源

Design of the diode trait tester based on 89C52
FENG Xiao-wei,LI Zheng-sheng,WANG Lei-yang. Design of the diode trait tester based on 89C52[J]. Electronic Design Engineering, 2011, 19(6): 50-52
Authors:FENG Xiao-wei  LI Zheng-sheng  WANG Lei-yang
Affiliation:101 Teaching and Research Room,The Second Artillery Engineering University,Xi’an 710025,China)
Abstract:By making good use of the intelligent control function of the Micro Controller Unit(MCU),the diode trait tester was designed based on the STC89C52,which could be used to test the trait of a diode rapidly.By loading constant current to diode through the stable linear current source,and measuring the voltage drop of the diode by high-precision analogue-to-digital converter(ADC),it can judge whether the diode is good or not,distinguish the polarity of the diode,and test the trait that the diode,which can avoid the fault of using a multimeter can only measure the polarity but not the trait.This device can be used to test the trait of a diode quickly,and to make sure that whether a diode can be used in the electronic design or not.
Keywords:diode  trait  tester  MCU  current source
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