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进口集成电路及其相应国产化集成电路的电磁脉冲损伤对比研究
引用本文:张 沛 武占成. 进口集成电路及其相应国产化集成电路的电磁脉冲损伤对比研究[J]. 微波学报, 2012, 28(S2): 323-326
作者姓名:张 沛 武占成
作者单位:军械工程学院 强电磁场环境模拟与防护技术国防科技重点实验室, 石家庄 050003
摘    要:引进武器装备的国产化一直是我军装备研究的重点,本文通过对某进口防空导弹武器系统中的五类集成电路和对应的国产集成电路进行了方波注入电磁损伤效应的研究,得到了进口器件和国产器件在损伤过程中的异同之处。

关 键 词:方波注入;敏感端对;电磁损伤

Electromagnetic Pulse Damage Comparative Study betweenImports of Integrated Circuits and their CorrespondingLocalization of Integrated Circuits
ZHANG Pei,WU Zhan-cheng. Electromagnetic Pulse Damage Comparative Study betweenImports of Integrated Circuits and their CorrespondingLocalization of Integrated Circuits[J]. Journal of Microwaves, 2012, 28(S2): 323-326
Authors:ZHANG Pei  WU Zhan-cheng
Abstract:Localization of the introduction of weapons and equipment have been the focus of the army's equipment, the studyof the square wave injection effects between imported air defense missile weapon system in the five categories of IC and thecorresponding domestic IC, the similarities and differences can obtained from the imported components and domestic devices inthe course of the injury.
Keywords:square wave injection   sensitive ports   electromagnetic damage
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