Microstructural studies on variation of defect parameters in Zr-Sn alloys and their transition with interchange of solvent and solute in Zr-Ti and Ti-Zr alloy systems by modified Rietveld method and Warren-Averbach method |
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Authors: | J Ghosh S K Chattopadhyay A K Meikap S K Chatterjee |
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Affiliation: | (1) Department of Physics, National Institute of Technology, 713 209 Durgapur, India;(2) Department of Metallurgical Engineering, National Institute of Technology, 713 209 Durgapur, India;(3) Present address: Department of Analytical Facility & XRD, Central Glass and Ceramic Research Institute, 700 032 Kolkata, India |
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Abstract: | The effects of deformation and the transition of microstructural defect states with the interchange of solvent and solute
in Ti-Zr and Zr-Ti alloys of six different compositions and Zr-Sn alloys in three different compositions have been investigated
by X-ray diffraction line profile analysis. The detailed analysis of the X-ray powder diffraction line profiles was interpreted
by Fourier line shape analysis using modified Rietveld method and Warren-Averbach method taking silicon as standard. Finally
the microstructural parameters such as coherent domain size, microstrains within domains, faulting probability and dislocation
density were evaluated from the analysis of X-ray powder diffraction data of Zr base Sn, Ti and Ti base Zr alloys by modified
Rietveld powder structure refinement. This analysis confirms that the growth fault, β, is totally absent or negligibly present
in Zr-Ti, Ti-Zr and Zr-Sn alloy systems, because the growth fault, β, has been observed to be either negative or very small
for these alloy systems. This analysis also revealed that the deformation fault, α, has significant presence in titanium-base
zirconium alloy systems but when zirconium content in the matrix goes on increasing beyond 50%, this faulting behaviour suffers
a drastic transition and faulting tendency abruptly drops to a level of negligible presence or zero. This tendency has also
been observed in Zr-Sn alloys signifying high stacking fault energy. Therefore, Zr and Zr-base alloys having high stacking
fault energy can be used as hard alloys in nuclear technology at high temperature. |
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Keywords: | X-ray diffraction Fourier line shape analysis modified Rietveld method Warren-Averbach method microstructural defect parameters Ti and Zr base alloys |
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