| 用双晶衍射法测定超微细粉粒度 |
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| 引用本文： | 曹宏,魏铭鉴.用双晶衍射法测定超微细粉粒度[J].武汉理工大学学报,1992(1). |
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| 作者姓名： | 曹宏 魏铭鉴 |
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| 作者单位： | 武汉工业大学资源工程系
(曹宏)，武汉工业大学测试中心(魏铭鉴) |
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| 摘 要： | 本文讨论了用X射线双晶衍射法测定超微细粉粒度及其分布时,测量背底的来源、它的扣除及实验数据校正等问题,使高精度的X射线双晶法实际用于小角散射测量成为可能。
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| 关 键 词： | X射线双晶衍射 超微细粉 小角散射 |
Measurement of the Particle Size of Ultrafine Powder with Double Crystal Diffraction Technique |
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| Cao Hong,Wei Mingjiao.Measurement of the Particle Size of Ultrafine Powder with Double Crystal Diffraction Technique[J].Journal of Wuhan University of Technology,1992(1). |
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| Authors: | Cao Hong Wei Mingjiao |
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| Affiliation: | Cao Hong;Wei Mingjiao |
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| Abstract: | The sources of measurement background, their substraction and the correctionof the test data have been studied in this paper, when the particle size of ultrafine powder andits distibution are measured by double crystal diffraction technique. It has been becoming reali-ty that the high precise double crystal technique is used to measure the small angle X-rayscattering. |
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| Keywords: | Double crystal X-ray diffraction Ultrafine powder Small angle X-ray scattering |
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