Failure mechanism models for electromigration |
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| Authors: | Young D Christou A |
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| Affiliation: | Maryland Univ., College Park, MD; |
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| Abstract: | This tutorial illustrates situations where electromigration (a wearout failure mechanism) in electronic devices can degrade performance. Electromigration and its relation to microstructure is discussed. Temperature considerations are treated. A practical model for electromigration and two application examples of it are given. Qualitative design procedures for avoiding solid-state electromigration failure are briefly discussed |
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