A scattering-type transverse resonance technique for thecalculation of (M) MIC transmission line characteristics

A scattering-type formulation of the transverse resonance technique is introduced and applied to a variety of currently practical (M) MIC configurations. By utilizing a reflection coefficient matrix representation of boundary conditions, the characteristics of open, conductor-backed and shielded microstrip, slotline, or coplanar waveguide can be calculated. Excellent agreement with measurements and theoretical data on fundamental and high-order mode characteristics is obtained. In contrast to other methods, which require mainframe support, the software based on this formulation is operational on 386-compatible personal computers