| 基于SRAM配置技术的FPGA测试方法研究 |
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| 引用本文： | 赵娟,王月玲,刘明峰,于宗光,王成.基于SRAM配置技术的FPGA测试方法研究[J].半导体技术,2007,32(9):804-808. |
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| 作者姓名： | 赵娟 王月玲 刘明峰 于宗光 王成 |
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| 作者单位： | 中国电子科技集团公司,第五十八研究所,江苏,无锡,214035;江苏大学,电气工程学院,江苏,镇江,212000 |
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| 摘 要： | 在FPGA的设计生产过程中,FPGA的测试是一个至关重要的环节.分析了基于SRAM配置技术的FPGA的结构组成及FPGA的基本测试方法.针对6000门可编程资源的FPGA,提出了一种基于阵列和长线线与测试CLB以及采用总线测试开关矩阵相结合的方法.该方法较利用与门或门传递错误信息的所需测试配置次数减少了一半,从而加快了测试速度.
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| 关 键 词： | FPGA测试 CLB测试 互连测试 故障覆盖率 |
| 文章编号： | 1003-353X（2007）09-0804-05 |
| 修稿时间： | 2007-03-15 |
Research on the Test of SRAM-Based FPGA |
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| ZHAO Juan,WANG Yue-ling,LIU Ming-feng,YU Zong-guang,WANG Cheng.Research on the Test of SRAM-Based FPGA[J].Semiconductor Technology,2007,32(9):804-808. |
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| Authors: | ZHAO Juan WANG Yue-ling LIU Ming-feng YU Zong-guang WANG Cheng |
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| Affiliation: | 1. The 58th Research Institute, CECT, Wuxi 214035, China ; 2. Institute of Electricity, Jiangsu University, Zhenfiang 212000, China |
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| Abstract: | The FPGA test is a crucial step in the design and manufacture.Firstly,the structure of SRAM-based FPGA and popular testing methods were presented.A method of CLB(configurable logic block)test that was array-based and wired-and testing combined with the method for programmable interconnect test that is the bus-based testing were adopted for the testing of FPGA of 6000-gates programmable resources.Compared with the way using and-or gate to pass faults,the proposed method can reduce the programmable number by 50% and speed up the FPGA test. |
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| Keywords: | FPGA test CLB test PI test fault coverage |
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