结合多信号模型与遗传算法的板级电路测点选取方法

针对传统的电路板测点选取方法需要的输入信息多、工作繁琐、效率低及难以得到全局最优解等问题,提出了一种基于多信号模型与遗传算法相结合的优化方法。首先,通过建立板级电路的多信号流系统模型,获取测点与对应板级电路组成单元的相关性矩阵,并对其进行进一步分析,得出测点组合的测试能力参数。在测点选取数量不大于给定值的情况下,选取测试能力参数作为遗传算法的适应度函数并进行优化搜索,以确定测点的优化选取方案。结合Multisim仿真软件进行低通有源滤波电路系统的故障模拟实验,仿真结果表明,基于多信号模型与遗传算法选取的板级电路测点组合对低通有源滤波电路中的绝大部分故障都有良好的检测和隔离能力,取得了良好的效果,同时该方法也适用于多种其他电路。

Measuring Point Selection Method of Board-level Circuit Based on Multi-signal Model and Genetic Algorithm

This paper proposed an optimization method by combining multi-signal model and genetic algorithm for the problems of many input messages,low efficiency,tedious work,and difficulty on getting a global optimal solution exis-ting in the traditional circuit board measuring point selection method.First,a multi-signal flow system model of the board level circuit is established to get the correlation matrix of measuring points and corresponding board level circuit components.Then a further analysis is taken on the correlation matrix,and the test ability parameters of measuring points combination is got.Second,when the number of selected measuring points is not bigger than the given value,the test capability parameters are selected as the fitness function of the genetic algorithm,and the search is optimized to determine the optimal selection of measuring points.Third,combining with Multisim simulation software, the fault simulation experiment of circuit system with active low-pass filter is carried out .The simulation results show that the combination of board-level circuit measuring point selection based on multi-signal model and genetic algorithm has good detection and isolation capabilities for most of the faults in active low-pass filter circuits,and achieves good results.Besides,this method is applicable to a variety of other circuits.