Measuring production yield for processes with multiple quality characteristics

Process yield is an important criterion used in the manufacturing industry for measuring process performance. Methods for measuring yield for processes with single characteristic have been investigated extensively. However, methods for measuring yield for processes with multiple characteristics have been comparatively neglected. In this paper, we develop a generalized yield index, called TS _pk,PC , based on the index S_pk introduced by Boyles (Journal of Quality Technology, 23, 17–26, 1991 Boyles, RA. 1991. The Taguchi capability index. J. Qual. Technol., 23: 17–26. [Taylor &; Francis Online], [Web of Science ®] , [Google Scholar]) using the principal component analysis (PCA) technique. We obtained a lower confidence bound (LCB) for the true process yield. The proposed method can be used to determine whether a process meets the preset yield requirement, and make reliable decisions. Examples are provided to demonstrate the proposed methodology.