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Monitoring nonlinear profiles adaptively with a wavelet-based distribution-free CUSUM chart
Authors:Huizhu Wang  Xiaoming Huo  Youngmi Hur  James R Wilson
Affiliation:1. H. Milton Stewart School of Industrial and Systems Engineering, Georgia Institute of Technology, Atlanta, GA, USA.;2. Department of Mathematics, Yonsei University, Seoul, Republic of Korea.;3. Edward P. Fitts Department of Industrial and Systems Engineering, North Carolina State University, Raleigh, NC, USA.
Abstract:
Keywords:quality control  high dimension  profile  CUSUM chart  distribution-free  discrete wavelet transform
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